Deterioration of device characteristics of MFSFET due to...

Deterioration of device characteristics of MFSFET due to fatigue

Lee, Kook Pyo, Kang, Seong Jun, Chang, Dong Hoon, Yoon, Yung Sup
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Volume:
40
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580108010847
Date:
January, 2001
File:
PDF, 311 KB
english, 2001
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