Deterioration of device characteristics of MFSFET due to fatigue
Lee, Kook Pyo, Kang, Seong Jun, Chang, Dong Hoon, Yoon, Yung SupVolume:
40
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580108010847
Date:
January, 2001
File:
PDF, 311 KB
english, 2001