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A contact resistance model for scanning probe phase-change memory
Wang, Lei, Wright, David, Aziz, Mustafa, Ying, Jin, Wei Yang, GuoVolume:
24
Language:
english
Journal:
Journal of Micromechanics and Microengineering
DOI:
10.1088/0960-1317/24/3/037001
Date:
March, 2014
File:
PDF, 891 KB
english, 2014