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[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - Intrinsic variability in nano-CMOS design and beyond
Yu Cao,, Wang, Chi-Chao, Yun Ye,, Gummalla, Samatha, Chakrabarti, ChaitaliYear:
2010
Language:
english
DOI:
10.1109/iedm.2010.5703382
File:
PDF, 161 KB
english, 2010