[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Symbolic Path Sensitization Analysis and Applications
Kang, Jian, Seth, Sharad C., Mehta, Shashank K.Year:
2007
Language:
english
DOI:
10.1109/ats.2007.21
File:
PDF, 206 KB
english, 2007