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[IEEE 9th International Vacuum Microelectronics Conference - St. Petersburg, Russia (7-12 July 1996)] 9th International Vacuum Microelectronics Conference - Emission stability of DLC coated metal-tips FEA
Jae Hoon Jung,, Byeong Kwon Ju,, Yun Hi Lee,, Kyu Chang Park,, Jin Jang,, Yu Ho Jung,, Chul Ju Kim,, Myung Hwan Oh,Year:
1996
Language:
english
DOI:
10.1109/ivmc.1996.601814
File:
PDF, 337 KB
english, 1996