[IEEE IEEE Workshop on Statistical Signal Processing, 2003...

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[IEEE IEEE Workshop on Statistical Signal Processing, 2003 - St. Louis, MO, USA (Sept. 28, - Oct. 1, 2003)] IEEE Workshop on Statistical Signal Processing, 2003 - Initial value diffoomorphic landmark matching and its application to shape statistics

Vaillant, M., Miller, M.I., Younes, L., Ceritoglu, C.
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Year:
2003
Language:
english
DOI:
10.1109/ssp.2003.1289405
File:
PDF, 24 KB
english, 2003
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