[IEEE 2009 14th IEEE European Test Symposium (ETS) - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - Automatic Functional Stress Pattern Generation for SoC Reliability Characterization
Appello, D., Bernardi, P., Cagliesi, R., Giancarlini, M., Grosso, M., Sanchez, E., Reorda, M. SonzaYear:
2009
Language:
english
DOI:
10.1109/ets.2009.16
File:
PDF, 282 KB
english, 2009