Extreme Ultraviolet Interferometric Lithography: A Path to Nanopatterning
Cerrina, F., Isoyan, A., Jiang, F., Cheng, Y. C., Leonard, Q., Wallace, J., Heinrich, K., Ho, A., Efremov, M., Nealey, P.Volume:
21
Language:
english
Journal:
Synchrotron Radiation News
DOI:
10.1080/08940880802268236
Date:
August, 2008
File:
PDF, 6.25 MB
english, 2008