[IEEE 2012 4th Electronic System-Integration Technology Conference (ESTC) - Amsterdam, Netherlands (2012.09.17-2012.09.20)] 2012 4th Electronic System-Integration Technology Conference - Reliability of silkscreen printed planar capacitors and inductors under accelerated thermal cycling and humidity bias life testing
Voutilainen, Juha-Veikko, Happonen, Tuomas, Hakkinen, JuhaYear:
2012
Language:
english
DOI:
10.1109/estc.2012.6542201
File:
PDF, 1.52 MB
english, 2012