[IEEE 2010 20th International Conference on Pattern...

  • Main
  • [IEEE 2010 20th International...

[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - A Comparative Study of Facial Landmark Localization Methods for Face Recognition Using HOG descriptors

Monzo, David, Albiol, Alberto, Albiol, Antonio, Mossi, Jose M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2010
Language:
english
DOI:
10.1109/icpr.2010.1145
File:
PDF, 549 KB
english, 2010
Conversion to is in progress
Conversion to is failed