[IEEE 2010 IEEE Fourth International Conference On Biometrics: Theory, Applications And Systems (BTAS) - Washington, DC, USA (2010.09.27-2010.09.29)] 2010 Fourth IEEE International Conference on Biometrics: Theory, Applications and Systems (BTAS) - Matching digital and scanned face images with age variation
Vatsa, Mayank, Singh, Richa, Bharadwaj, Samarth, Bhatt, Himanshu S., Noore, AfzelYear:
2010
Language:
english
DOI:
10.1109/btas.2010.5634503
File:
PDF, 864 KB
english, 2010