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Dependence of the Noise Behavior on the Drain Current for Thin Film Transistors
Tai, Ya-Hsiang, Chang, Chun-Yi, Hsieh, Chung-Lun, Yang, Yung-Hsuan, Chao, Wei-Kuang, Chen, Huan-EanVolume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2291565
Date:
February, 2014
File:
PDF, 328 KB
english, 2014