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[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Assessment of fully-depleted planar CMOS for low power complex circuit operation
Ren, Z., Mehta, S., Cai, J., Wu, S., Zhu, Y., Kanarsky, T., Kanakasabapathy, S., Edge, L.F., Zhang, R., Lindo, P., Koshy, J., Tabakman, K., Kulkarni, P., Sardesai, V., Cheng, K., Khakifirooz, A., DoriYear:
2011
Language:
english
DOI:
10.1109/iedm.2011.6131560
File:
PDF, 1.21 MB
english, 2011