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[IEEE 2001 IEEE Autotestcon Processing. IEEE Systems Readiness Technology Conference - Valley Forge, PA, USA (20-23 Aug. 2001)] 2001 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. (Cat. No.01CH37237) - A singular pencil model fault diagnosis strategy for an industrial process
Xiaochun George Wang,, Wei Liu,Year:
2001
Language:
english
DOI:
10.1109/autest.2001.949480
File:
PDF, 556 KB
english, 2001