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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Optical Diagnostics for IBM POWER6- Microprocessor
Song, P., Ippolito, S., Stellari, F., Sylvestri, J., Diemoz, T., Smith, G., Muench, P., James, N., Seongwon Kim,, Saenz, H.Year:
2008
Language:
english
DOI:
10.1109/test.2008.4700597
File:
PDF, 579 KB
english, 2008