[IEEE 51st ARFTG Conference Digest - Baltimore, MD, USA...

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[IEEE 51st ARFTG Conference Digest - Baltimore, MD, USA (1998.06.12-1998.06.12)] 51st ARFTG Conference Digest - A Test Board for Multiport Immittance Measurement and Characterization of RF-IC Packages

Tripathi, Alok, Lutz, Rick, Tripathi, V.K., Wu, Henry Hungjen, Meyer, Jeffrey W., Hutchison, Brian
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Year:
1998
Language:
english
DOI:
10.1109/arftg.1998.327297
File:
PDF, 369 KB
english, 1998
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