[IEEE 51st ARFTG Conference Digest - Baltimore, MD, USA (1998.06.12-1998.06.12)] 51st ARFTG Conference Digest - A Test Board for Multiport Immittance Measurement and Characterization of RF-IC Packages
Tripathi, Alok, Lutz, Rick, Tripathi, V.K., Wu, Henry Hungjen, Meyer, Jeffrey W., Hutchison, BrianYear:
1998
Language:
english
DOI:
10.1109/arftg.1998.327297
File:
PDF, 369 KB
english, 1998