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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude
Abe, Kenichi, Teramoto, Akinobu, Sugawa, Shigetoshi, Ohmi, TadahiroYear:
2011
Language:
english
DOI:
10.1109/irps.2011.5784503
File:
PDF, 534 KB
english, 2011