[IEEE 2012 IEEE International Symposium on Circuits and Systems - ISCAS 2012 - Seoul, Korea (South) (2012.05.20-2012.05.23)] 2012 IEEE International Symposium on Circuits and Systems - Design for cold test elimination - facing the Inverse Temperature Dependence (ITD) challenge
Abdul Latif, Mohd Azman, Zain Ali, Noohul Basheer, Hussin, Fawnizu AzmadiYear:
2012
Language:
english
DOI:
10.1109/iscas.2012.6271971
File:
PDF, 1.10 MB
english, 2012