Radiation tolerance of the FOXFET biasing scheme for AC-coupled Si microstrip detectors
Bacchetta, N., Bisello, D., Canali, C., Da Ros, R., Fuochi, P.G., Fusaro, G., Giraldo, A., Gotra, Y., Paccagnella, A., Verzellesi, G.Volume:
40
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.273500
Date:
January, 1993
File:
PDF, 719 KB
english, 1993