Computer controlled drifting of Si(Li) detectors
Landis, D.A., Wong, Y.K., Walton, J.T., Goulding, F.S.Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.34431
Date:
January, 1989
File:
PDF, 459 KB
english, 1989