[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Innovative practices session 5C: Machine learning and data analysis in test
Biswas, Sounil, Carulli, John, Drmanac, Dragoljub Gagi, Bhattacherjee, ArpanYear:
2014
Language:
english
DOI:
10.1109/vts.2014.6818766
File:
PDF, 101 KB
english, 2014