Radio-Frequency-Noise Characterization and Modeling of...

IEEE Electron Device Letters 2008 / 01 Vol. 29; Iss. 1

Radio-Frequency-Noise Characterization and Modeling of Type-II InP–GaAsSb DHBT

Chuang, Yu-Ju, Cimino, Kurt, Stuenkel, Mark, Snodgrass, William, Feng, Milton
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Volume:
29
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.912017
Date:
January, 2008
File:
PDF, 181 KB
english, 2008
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