[IEEE 2010 18th IEEE/IFIP International Conference on VLSI and System-on-Chip (VLSI-SoC) - Madrid, Spain (2010.09.27-2010.09.29)] 2010 18th IEEE/IFIP International Conference on VLSI and System-on-Chip - Output probability density functions of logic circuits: Modeling and fault-tolerance evaluation
Stanisavljevic, Milos, Schmid, Alexandre, Leblebici, YusufYear:
2010
Language:
english
DOI:
10.1109/vlsisoc.2010.5642682
File:
PDF, 261 KB
english, 2010