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[IEEE 17th International Zurich Symposium on Electromagnetic Compatibility - Singapore (2006.02.27-2006.03.3)] 2006 17th International Zurich Symposium on Electromagnetic Compatibility - Breakdown predictions of microstrip interconnects and coplanar waveguide-built devices in the presence of HP-EMPs
Wen-YanYin,, Dong, X.T., Junfa Mao,, Le-Wei Li,Year:
2006
Language:
english
DOI:
10.1109/emczur.2006.214967
File:
PDF, 188 KB
english, 2006