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[IEEE 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Raleigh, NC, USA (2005.11.6-2005.11.6)] 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Local 3D map building and error analysis based on stereo vision
Huahua Chen,, Zezhong Xu,Year:
2005
Language:
english
DOI:
10.1109/iecon.2005.1568934
File:
PDF, 482 KB
english, 2005