[IEEE 2000 50th Electronic Components and Technology Conference - Las Vegas, NV, USA (21-24 May 2000)] 2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070) - Experimental and numerical reliability investigations of FCOB assemblies with process-induced defects
Schubert, A., Dudek, R., Kloeser, J., Michel, B., Reichl, H., Hauck, T., Kaskoun, K.Рік:
2000
Мова:
english
DOI:
10.1109/ectc.2000.853224
Файл:
PDF, 1.33 MB
english, 2000