![](/img/cover-not-exists.png)
[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Critical technology issues for deca-nanometer MOSFETs
Ostling, Mikael, Malm, B., Haartman, Martin, Hallstedt, Julius, Hellstrom, Per-erik, Zhang, ShiliYear:
2006
Language:
english
DOI:
10.1109/icsict.2006.306047
File:
PDF, 187 KB
english, 2006