[IEEE 2006 8th International Conference on Solid-State and...

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[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Critical technology issues for deca-nanometer MOSFETs

Ostling, Mikael, Malm, B., Haartman, Martin, Hallstedt, Julius, Hellstrom, Per-erik, Zhang, Shili
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Year:
2006
Language:
english
DOI:
10.1109/icsict.2006.306047
File:
PDF, 187 KB
english, 2006
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