[IEEE 2003 IEEE Conference on Electron Devices and Solid-State Circuits - Hong Kong, China (16-18 Dec. 2003)] 2003 IEEE Conference on Electron Devices and Solid-State Circuits (IEEE Cat. No.03TH8668) - Failure of power DMOS transistor arrays under unclamped inductive switching stress conditions
Deckelmann, A.I., Wachutka, G., Krumrey, J., Hirler, F., Henninger, R.Year:
2003
Language:
english
DOI:
10.1109/edssc.2003.1283537
File:
PDF, 266 KB
english, 2003