[IEEE 2006 IEEE Instrumentation and Measurement Technology...

  • Main
  • [IEEE 2006 IEEE Instrumentation and...

[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - The Back-Projection Algorithm Based on Electric Lines of Force for Single Drive Electrode ERT

Zhao, Wuling, Dong, Feng
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2006
Language:
english
DOI:
10.1109/imtc.2006.328544
File:
PDF, 470 KB
english, 2006
Conversion to is in progress
Conversion to is failed