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[IEEE 2012 24th International Conference on Microelectronics (ICM) - Algiers, Algeria (2012.12.16-2012.12.20)] 2012 24th International Conference on Microelectronics (ICM) - Fault injection for verifying testability of fault tolerant structures at the Verilog level
Abdelmalek, G. Ait, Ziani, R., laghrouche, M.Year:
2012
Language:
english
DOI:
10.1109/icm.2012.6471397
File:
PDF, 278 KB
english, 2012