![](/img/cover-not-exists.png)
[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - A Study of hafnium dioxide (HfO2) dielectric charges
Zoolfakar, Ahmad Sabirin, Hashim, Hashimah, Taylor, SteveYear:
2008
Language:
english
DOI:
10.1109/icsict.2008.4734782
File:
PDF, 1.41 MB
english, 2008