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[IEEE 2011 International Conference on Mechatronic Science, Electric Engineering and Computer (MEC) - Jilin, China (2011.08.19-2011.08.22)] 2011 International Conference on Mechatronic Science, Electric Engineering and Computer (MEC) - A new measurement system based on photoelectric colorimetry
Chen, Gehua, Wang, YuhangYear:
2011
Language:
english
DOI:
10.1109/mec.2011.6025987
File:
PDF, 228 KB
english, 2011