[IEEE 2009 IEEE International Reliability Physics Symposium...

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[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - A study bipolar phototransistor action existing in CMOS process triggered by a laser beam used in a C-AFM system

Hung-Sung Lin,, Mong-Sheng Wu,, Tsui-Hua Huang,
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Year:
2009
Language:
english
DOI:
10.1109/irps.2009.5173353
File:
PDF, 452 KB
english, 2009
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