[IEEE 2009 14th IEEE European Test Symposium (ETS) - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - Masking of X-values by Use of a Hierarchically Configurable Register
Rabenalt, Thomas, Goessel, Michael, Leininger, AndreasYear:
2009
DOI:
10.1109/ets.2009.11
File:
PDF, 382 KB
2009