Quantitative characterization of sputter-process-induced nano-voids and porous film state in magnetic thin films
Chuan Gao,, Malmhall, R., Ga-Lane Chen,Volume:
33
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/20.617828
Date:
January, 1997
File:
PDF, 384 KB
english, 1997