[IEEE 2010 International Conference on Electronics and Information Engineering (ICEIE 2010) - Kyoto, Japan (2010.08.1-2010.08.3)] 2010 International Conference on Electronics and Information Engineering - A Neural network based approach for modeling of severity of defects in function based software systems
Jianhong, Zhou, Sandhu, Parvinder S., Rani, SeemaYear:
2010
Language:
english
DOI:
10.1109/iceie.2010.5559743
File:
PDF, 824 KB
english, 2010