[IEEE 2007 Joint 50th IEEE International Midwest Symposium...

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[IEEE 2007 Joint 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) and the IEEE Northeast Workshop on Circuits and Systems (NEWCAS 2007) - Montreal, QC, Canada (2007.08.5-2007.08.8)] 2007 50th Midwest Symposium on Circuits and Systems - Face recognition for target detection on PCA features with outlier information

Yen-Lun Chen,, Zheng, Yuan F.
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Year:
2007
Language:
english
DOI:
10.1109/mwscas.2007.4488700
File:
PDF, 338 KB
english, 2007
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