[IEEE 2013 IEEE International Ultrasonics Symposium (IUS) - Prague, Czech Republic (2013.07.21-2013.07.25)] 2013 IEEE International Ultrasonics Symposium (IUS) - Accurate determination of thin film properties using SAW differential delay lines
Knapp, Matthias, Jager, Philipp, Grunauer, Gerold, Scheinbacher, Gunter, Bleyl, Ingo, Reindl, Leonhard M.Year:
2013
Language:
english
DOI:
10.1109/ultsym.2013.0434
File:
PDF, 998 KB
english, 2013