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IEEE Transactions on Nuclear Science 2010 / 12

Process and Contamination Effects on the Single-Event Response of AlSb/InAs HEMTs

DasGupta, Sandeepan, McMorrow, Dale, Reed, Robert A., Schrimpf, Ronald D., Boos, J. Brad, Ramachandran, Vishwa
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Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2010.2075941
Date:
December, 2010
File:
PDF, 702 KB
english, 2010
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