[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Enhanced secondary electron injection in novel SiGe flash memory devices
Kencke, D.L., Xin Wang,, Ouyang, Q., Mudanai, S., Tasch, A., Banerjee, S.K.Year:
2000
Language:
english
DOI:
10.1109/iedm.2000.904269
File:
PDF, 319 KB
english, 2000