[IEEE 2008 58th Electronic Components and Technology Conference (ECTC 2008) - Lake Buena Vista, FL, USA (2008.05.27-2008.05.30)] 2008 58th Electronic Components and Technology Conference - Temperature nonuniformity and bias-dependent thermal resistance in multi-finger MOS transistors
Xi Wang,, Shakouri, Ali, Wysocki, Jacob, Wincn, Mike, Petrotti, KenYear:
2008
Language:
english
DOI:
10.1109/ectc.2008.4550282
File:
PDF, 573 KB
english, 2008