[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Investigation of trapped charge in oxides under fowler-nordheim stress using low bias conditions
Duane, R., Martin, A., O'Donovan, P., Hurley, P., O'Sullivan, P., Mathewson, A.Year:
1996
Language:
english
DOI:
10.1109/esref.1996.888177
File:
PDF, 275 KB
english, 1996