[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - A combined packet and circuit switching routing algorithm for networks-on-chips
Sabry, Mohamed M., Bedor, Hassan Shehata, Watheq El-Kharashi, M., Salem, AshrafYear:
2008
Language:
english
DOI:
10.1109/idt.2008.4802459
File:
PDF, 145 KB
english, 2008