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[IEEE IGARSS 2010 - 2010 IEEE International Geoscience and Remote Sensing Symposium - Honolulu, HI, USA (2010.07.25-2010.07.30)] 2010 IEEE International Geoscience and Remote Sensing Symposium - Comparison of a multilateral-based acquisition with Terrestrial Laser Scanner and profilometer technique for soil roughness measurement
Perez-Gutierrez, C., Alvarez-Mozos, J., Martinez-Fernandez, J., Sanchez, N.Year:
2010
Language:
english
DOI:
10.1109/igarss.2010.5649200
File:
PDF, 212 KB
english, 2010