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[IEEE 2010 IEEE Custom Integrated Circuits Conference -CICC 2010 - San Jose, CA, USA (2010.09.19-2010.09.22)] IEEE Custom Integrated Circuits Conference 2010 - Reliability analysis of analog circuits using quadratic lifetime worst-case distance prediction
Pan, Xin, Graeb, HelmutYear:
2010
Language:
english
DOI:
10.1109/cicc.2010.5617446
File:
PDF, 445 KB
english, 2010