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[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Enhancing testability by structured partial scan
Wohl, P., Waicukauski, J.A., Colburn, J.E.Year:
2012
Language:
english
DOI:
10.1109/vts.2012.6231095
File:
PDF, 502 KB
english, 2012