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[IEEE 2014 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2014.6.9-2014.6.12)] 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers - Sub-100 nm regrown S/D Gate-Last In0.7Ga0.3As QW MOSFETs with μn,eff > 5,500 cm2/V-s
Shin, C.-S., Park, W.-K., Shin, SH., Cho, YD., Ko, DH., Kim, T.-W., Koh, D.H., Kwon, HM., Hill, R. J. W., Kirsch, P., Maszara, W., Kim, D.-H.Year:
2014
Language:
english
DOI:
10.1109/vlsit.2014.6894351
File:
PDF, 938 KB
english, 2014