[IEEE 2010 IEEE Conference on Computer Vision and Pattern...

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[IEEE 2010 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - San Francisco, CA, USA (2010.06.13-2010.06.18)] 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Graph cut segmentation with a global constraint: Recovering region distribution via a bound of the Bhattacharyya measure

Ayed, Ismail Ben, Chen, Hua-mei, Punithakumar, Kumaradevan, Ross, Ian, Li, Shuo
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Year:
2010
Language:
english
DOI:
10.1109/cvpr.2010.5540045
File:
PDF, 1.45 MB
english, 2010
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