[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - Improved wafer-level spatial analysis for I/sub DDQ/ limit setting
Sabade, S., Walker, D.M.H.Year:
2001
Language:
english
DOI:
10.1109/test.2001.966621
File:
PDF, 953 KB
english, 2001