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[IEEE IEEE Custom Integrated Circuits Conference 2006 - San Jose, CA, USA (2006.09.10-2006.09.13)] IEEE Custom Integrated Circuits Conference 2006 - Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling
Ibe, Eishi, Chung, Sung, Wen, Shijie, Yamaguchi, Hironaru, Yahagi, Yasuo, Kameyama, Hideaki, Yamamoto, Shigehisa, Akioka, TakashiYear:
2006
Language:
english
DOI:
10.1109/cicc.2006.321010
File:
PDF, 6.48 MB
english, 2006